2 options
In-process optical metrology for precision machining : fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering : 30 March-3 April 1987, The Hague, Netherlands / editor, Peter Langenbeck ; sponsored by SPIE.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium on Optical and Optoelectronic Applied Sciences and Engineering (4th : 1987 : Hague, Netherlands)
- International Symposium on Optical and Optoelectronic Applied Sciences and Engineering.
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; 802.
- Proceedings of SPIE
- Language:
- English
- Subjects (All):
- Machining--Congresses.
- Machining.
- Optical measurements--Congresses.
- Optical measurements.
- Physical Description:
- 1 online resource (viii, 217 pages) : illustrations.
- Place of Publication:
- Bellingham, Wash. : SPIE, 1987.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 13, 2018).
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.