2 options
Interferometric metrology : 31st annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering : 17-21 August 1987, San Diego, CA, United States / editor, Norbert A. Massie ; sponsored by SPIE.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering (31st : 1987 : San Diego, Calif.)
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 0816.
- Proceedings of SPIE ; Volume 0816
- Language:
- English
- Subjects (All):
- Holographic interferometry--Congresses.
- Holographic interferometry.
- Physical Description:
- 1 online resource (vi, 239 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1987.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 10, 2018).
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