Optical Metrology and Inspection for Industrial Applications. VI : 21-23 October 2019, Hangzhou, China / Sen Han [and three others], editors.

Format:

Book

Contributor:

Han, Sen, editor.

Series:

Proceedings of SPIE--the International Society for Optical Engineering ; Volume 11189.

Proceedings of SPIE ; Volume 11189

Language:

English

Subjects (All):

Engineering inspection--Congresses.

Engineering inspection.

Optical detectors--Industrial applications--Congresses.

Optical detectors.

Optical measurements--Congresses.

Optical measurements.

Physical Description:

1 online resource (412 pages) : illustrations.

Place of Publication:

Bellingham, Washington : SPIE, [2020]

Contents:

How can a plenoptic camera be used as a metrology tool? / Zewei Cai; Xiaoli Liu; Giancarlo Pedrini; Wolfgang Osten; Xiang Peng

A spin self-sustaining atomic magnetometer for high-precision measurements in large magnetic fields / Qin Zhao; Bolin Fan; Shiguang Wang; Lijun Wang

In-situ detection and evaluation of wear state of micro-powder diamond wheel in optics grinding / Lian Zhou; Qiancai Wei; Xianhua Chen; Qinghua Zhang; Jian Wang; Qiao Xu

Interferometric and deflectometric flatness metrology with nanometre measurement uncertainties for optics up to 1 metre at PTB / G. Ehret; H. Reinsch; M. Schulz

A three-dimension high-precision and non-contact dynamic angular displacement measurement system based on heterodyne interference / Shuai Zhao; Dengwei Zhang; Yilan Zhou; Xiaowu Shu

Transmission measurement by using different wavelengths than designed wavelength / Sen Han; Qiyuan Zhang; Haoyu Wang; Yan Wang

Phase unwrapping and range enlargement in phase-shifting dual-wavelength digital holography / Yu Cheng; Xiangchao Zhang; He Yuan; Wei Wang; Shaoliang Li; Siping Peng

Microscopic fringe projection profilometry comparison based on stereoscopic microscope and telecentric lenses / Yan Hu; Yichao Liang; Tianyang Tao; Wei Yin; Jiaming Qian; Shijie Feng; Chao Zuo; Qian Chen

Temporal phase unwrapping using multi-scale deep neural networks / Wei Yin; Chao Zuo; Shijie Feng; Tianyang Tao; Qian Chen

High-speed 3D shape measurement with the multi-view system using deep learning / Wei Yin; Chao Zuo; Shijie Feng; Tianyang Tao; Qian Chen

Detect curing extent of conformal coating using speckle variance optical coherence tomography / Xiwen Wang; Qian Wu; Jie Zhu; Jianing Dai; Jianhua Mo

Improve 3D shape reconstruction with dual-camera measurement fusion / Yuewen Zhu; Qinghua Guo; Jiangtao Xi; Yanguang Yu; Jun Tong

Detection and recognition of water quality based on UV-visible spectroscopy in different living areas of Urumqi / Yushuai Yuan; Cheng Chen; Chen Chen; Ziwei Yan; Ziwei Zhang; Xiaoyi Lv Sr.; Shengya Feng

Two-wavelengths digital holography for erosion measurements inside the ITER Tokamak / G. Pedrini; A. Calabuig; G. Jagannathan; M. Kempenaars; G, Vayakis; W. Osten

The application of Ag+ detection based on porous silicon SERS substrates / Chen Chen; Yushuai Yuan; Xiaorong Ma; Ziwei Zhang; Xiaoyi Lv; Shengya Feng

Multilateration with laser tracker applied in large-scale coordinate calibration / Yu Ren; Yunxia Fu; Fangfang Liu; Feng Zhang

Exploratory study on rapid identification of arsenic in water based on Raman spectroscopy / Ziwei Yan; Cheng Chen; Xiaorong Ma; Ziwei Zhang; Xiaoyi Lv; Shengya Feng

Development and characterization of nanometer film thickness standards / Zhiguo Han; Faguo Liang; Suoyin Li; Yanan Feng; Xiaodong Zhang

Discontinuity-induced measurement artifact reduction of structured light system based on a deconvolution method / Yuxiang Wu; Xiojian Cai; Jinjin Zhu; Xiaopeng Shao

Research on full-aperture surface shape in-situ measurement technology for grinding large diameter optics / Qiancai Wei; Lian Zhou; Xianhua Chen; Nan Zheng; Bo Zhong; Jian Wang

High accurate three-dimensional shape measurement of discontinuous specular surfaces by stereo direct phase-measuring deflectometry / Yuemin Wang; Zonghua Zhang; Nan Gao; Zhaozong Meng

Optical metrology for the morphological characterization of surfaces: limitations, innovations, registration and new directions / J. W. McBride; K. J. Cross; T. G. Bull

Random two-step phase estimation based on Lissajous ellipse fitting method with light source intensity instability / Jinjin Zhu; Yuxiang Wu; Yashuo Bai; Wei Li; Xiaopeng Shao

A new method for fringe order error correction in fringe projection profilometry / Yiwei Zhang; Chengpu Duan; Jiangtao Xi; Jun Tong; Yanguang Yu; Qinghua Guo

High-speed 3D measurements at 20,000Hz with deep convolutional neural networks / Shijie Feng; Chao Zuo; Qian Chen

Fringe projection profilometry for the 3D shape measurement of objects with three-dimensional movements / Chengpu Duan; Yiwei Zhang; Jiangtao Xi; Jun Tong; Yanguang Yu; Qinghua Guo

Optical cryptosystem with complementary masks / Wenqing Sun; Haiping Zhang; Qiliang Teng; Jun Wang; Quanying Wu

Experimental study on defect detection method for spherical surface / ChengRui Li; Xi Hou; XiaoSong Du; HaiYang Quan; XiaoChuan Hu

Prediction of the angle of rotation to be caused by optical rotation phenomenon in optical active materials and observation of resultant changes in visible colors of transmitting light beams / Seika Tokumitsu; Makoto Hasegawa

A planar pattern based calibration method for high precision structured laser triangulation measurement / Ruiming Chen; Xinghui Li; Xiaohao Wang; Jianxiong Li; Gaopeng Xue; Qian Zhou; Kai Ni

A novel calibration transfer method of NIR spectra to identify ultra-low concentration of pesticide residues / Chaowei Zhuang; Jingtao Fan; Jing Zhang; Bin Gao; Qionghai Dai

Method for evalutating strength of photogrammetry network based on attenuation factor / Bolun Zhang

Defect detection of optical elements surfaces using curvelet transform / LinFu Li; JianJun Chen; Jinbao Huang

System construction and uncertainty evaluation of absolute measurement of infrared spectral radiance / Shufang He; Yanfei Wang; Caihong Dai; Jinyuan Liu; Guojin Feng

Partial reconstruction of phase of interference pattern based on a generalized discrete Fourier transform / Dong Wei; Meiyun Chen

Inversion algorithm for detection of H2S gas concentration by differential absorption spectroscopy / Shu wang Chen; Xiao wei Yin; Zhen zhen Wang; Tong tong Song; Shuli Song

Odorous emission monitoring based on differential optical absorption spectroscopy / Rui Xue; Mingxuan Li; Xiaohong Han; Jie Guo; Han Zhang

Ultra-low flue gas emission monitoring based on differential optical absorption spectroscopy / Jinbao Zhao; Jie Guo; Jiatong Shi; Zhiwei Yu; Han Zhang

An automatic metrology using the laser displacement sensor for the corrugation height of corrugated plate / Chengxing Wu; Baijin Chen; Chunsheng Ye

Study of vehicle exhaust detection based on TDLAS / Kexin Zhang; Weimin Zhu; Jie Zhao; Jinyu Lu; Tao Liu

Phase correction method for dynamic 3D measurement based on fringe projection / Xingcan Zhou; Yong Li; Kai Huang; Yiteng Jiang

New calibration approach for 3D measurement system based on the light-source-stepping method / Yiteng Jiang; Yong Li; Kai Huang; Xingcan Zhou

Thickness measurement opaque material by swept source optical coherence tomography / Qian Wu; Jianing Dai; Jie Zhu; Xiwen Wang; Xinjian Chen; Jianhua Mo

Colored Ronchi pattern for fringe projection profilometry / Jayson P.

Cabanilla; Nathaniel Hermosa

Temperature compensation for LED filament standard lamps / Jinyun Yan; Hui Liu; Weiqiang Zhao; Ying Su

Single-shot 3D shape measurement with spatial frequency multiplexing using deep learning / Chen Yang; Wei Yin; Hao Xu; Jiachao Li; Shijie Feng; Tianyang Tao; Qian Chen; Chao Zuo

Realization of high-intensity focusing ultrasound pressure and detection of sound field / Jie Zhao; Weimin Zhu; Jinyu Lu; Tao Liu; Dayong Wang

Space-time adaptive: system, resolution, and configuration / Hua Liu; Mingsuo Li; Ronggang Zhu; Liwei Zhou

Research on nondestructive measurement of spectral responsivity of photovoltaic modules / Junchao Zhang; Yangyang Wang; Limin Xiong; Yingwei He; Haifeng Meng; Bifeng Zhang; Chuan Cai; Shuai Man

Spectral responsivity measurements of monolithic GaInP2/InGaAs/Ge triple-junction solar cells / Haifeng Meng; Hongdong Yang; Junchao Zhang; Yingwei He; Bifeng Zhang; Chuan Cai; Shuai Man; Limin Xiong

Uncertainty evaluation of colour correction factor using Monte Carlo method in LED photometry measurement / Weiqiang Zhao; Hui Liu; Jinyun Yan; Ying Su; Lin Jiang

Implementation of moving target detection and tracking algorithms based on FPGA / Kai Xing; Binhua Li; Yong Tao; Jinliang Wang; Chun He

Research on 24-h forecasting of solar irradiance based on multilayer perceptron model / Bixuan Gao; Xiaoqiao Huang; Junsheng Shi

Lucky imaging system on FPGA by using ethernet transmission / Chenhao Duan; Binhua Li; Zhen Chen; Chun He; Jinliang Wang.

Notes:

Description based on publisher supplied metadata and other sources.

ISBN:

1-5106-3096-1