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Anomaly Detection and Imaging with X-Rays (ADIX) V / edited by Amit Ashok, Joel A. Greenberg, Michael E. Gehm.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 11404.
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 11404
- Language:
- English
- Subjects (All):
- Pattern recognition systems--Congresses.
- Pattern recognition systems.
- Physical Description:
- 1 online resource : illustrations.
- Other Title:
- Anomaly Detection and Imaging with X-Rays
- Place of Publication:
- Bellingham, Washington : SPIE, 2020.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-3586-6
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