Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA

Format:

Book

Contributor:

Geer, Robert E, Contributor.

Jet Propulsion Laboratory (U.S.), Content Provider.

Society of Photo-Optical Instrumentation Engineers, Content Provider.

National Science Foundation (U.S.), Content Provider.

American Society of Mechanical Engineers, Content Provider.

Series:

Proceedings of SPIE Testing, reliability, and application of micro- and nano-material systems IV

Language:

English

Subjects (All):

Electrooptical devices--Materials--Testing--Congresses.

Electrooptical devices.

Photonics--Testing--Materials--Congresses.

Photonics.

Nanostructured materials--Testing--Congresses.

Nanostructured materials.

Microelectromechanical systems--Testing--Congresses.

Microelectromechanical systems.

Place of Publication:

[Place of publication not identified] SPIE 2006

Language Note:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph