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Interferometry XIII. 16-17 August, 2006, San Diego, California, USA / Applications
- Format:
- Book
- Series:
- Proceedings of SPIE Interferometry XIII.
- Language:
- English
- Subjects (All):
- Interferometry--Industrial applications--Congresses.
- Interferometry.
- Measurement--Congresses.
- Measurement.
- Other Title:
- Interferometry XIII
- Place of Publication:
- [Place of publication not identified] SPIE 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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