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Signal analysis, measurement theory, photo-electronic technology, and artificial intelligence : 13-15 October 2006, Beijing, China
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on Instrumentation and Control Technology, Corporate Author.
- Conference Name:
- International Symposium on Instrumentation and Control Technology (6th : 2006 : Beijing, China)
- Series:
- Proceedings of SPIE Signal analysis, measurement theory, photo-electronic technology, and artificial intelligence
- Language:
- English
- Subjects (All):
- Optoelectronics--Design and construction--Congresses.
- Optoelectronics.
- Optoelectronic devices--Congresses.
- Optoelectronic devices.
- Signal processing--Congresses.
- Signal processing.
- Measurement--Congresses.
- Measurement.
- Electronic control--Congresses.
- Electronic control.
- Other Title:
- Sixth International Symposium on Instrumentation and Control Technology
- Place of Publication:
- [Place of publication not identified] SPIE 2006
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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