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Model-based vision development and tools : 14-15 November 1991, Boston, Massachusetts
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Model-based vision development and tools
- Language:
- English
- Subjects (All):
- Optical pattern recognition--Congresses.
- Optical pattern recognition.
- Pattern recognition systems--Congresses.
- Pattern recognition systems.
- Place of Publication:
- [Place of publication not identified] SPIE 1992
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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