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Optically based methods for process analysis : 22-27 March 1992, Somerset, New Jersey, United States / editor, David S. Bomse [and seven others] ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 1681.
- Proceedings of SPIE ; Volume 1681
- Language:
- English
- Subjects (All):
- Chemical process control--Congresses.
- Chemical process control.
- Quality control--Optical methods--Congresses.
- Quality control.
- Spectrum analysis--Congresses.
- Spectrum analysis.
- Physical Description:
- 1 online resource (384 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1992.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 1, 2018).
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