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Machine vision applications in industrial inspection : 3-4 February 1993, San Jose, California
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Machine vision applications in industrial inspection
- Language:
- English
- Subjects (All):
- Quality control--Automation--Congresses--Optical methods.
- Quality control.
- Computer vision--Industrial applications--Congresses.
- Computer vision.
- Place of Publication:
- [Place of publication not identified] SPIE 1993
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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