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Instrumentation, metrology, and standards for nanomanufacturing II : 10 August 2008, San Diego, California, USA
- Format:
- Book
- Series:
- Proceedings of SPIE Instrumentation, metrology, and standards for nanomanufacturing II
- Language:
- English
- Subjects (All):
- Nanostructured materials--Congresses.
- Nanostructured materials.
- Microfabrication--Congresses.
- Microfabrication.
- Nanomanufacturing--Congresses.
- Nanomanufacturing.
- Place of Publication:
- [Place of publication not identified] SPIE 2008
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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