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Interferometry XIV : techniques and analysis :11-13 August 2008, San Diego, California, USA / Joanna Schmit, Katherine Creath, Catherine E. Towers, editors ; sponsored ... by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 7063.
- Proceedings of SPIE, 0277-786X ; v. 7063
- Language:
- English
- Subjects (All):
- Interferometry--Methodology--Congresses.
- Interferometry.
- Measurement--Congresses.
- Measurement.
- Metrology--Congresses.
- Metrology.
- Physical Description:
- 1 online resource (1 v. (various pagings) ) ill. ;
- Place of Publication:
- Bellingham, Wash. : SPIE, c2008.
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- Includes bibliographical references and index.
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