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Advanced characterization techniques for optics, semiconductors, and nanotechnologies III : 28-29 August 2007, San Diego, California, USA
- Format:
- Book
- Series:
- Proceedings of SPIE Advanced characterization techniques for optics, semiconductors, and nanotechnologies III
- Language:
- English
- Subjects (All):
- Optoelectronics--Characterization--Congresses.
- Optoelectronics.
- Optoelectronic devices--Optical properties--Congresses.
- Optoelectronic devices.
- Optical measurements--Congresses.
- Optical measurements.
- Semiconductors--Congresses.
- Semiconductors.
- Thin films--Congresses.
- Thin films.
- Nanotechnology--Congresses.
- Nanotechnology.
- Place of Publication:
- [Place of publication not identified] SPIE 2007
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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