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Optical measurement systems for industrial inspection II : applications in production engineering : 20-21 June, 2001, Munich, Germany
- Format:
- Book
- Series:
- SPIE proceedings series Optical measurement systems for industrial inspection II
- Language:
- English
- Subjects (All):
- Engineering inspection--Optical methods--Congresses.
- Engineering inspection.
- Quality control--Industrial applications--Congresses.
- Quality control.
- Optical instruments--Industrial applications--Congresses.
- Optical instruments.
- Optical detectors--Congresses.
- Optical detectors.
- Other Title:
- Optical Measurement Systems for Industrial Inspection II
- Place of Publication:
- [Place of publication not identified] SPIE 2001
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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