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Soft X-ray and EUV imaging systems II : 31 July-1 August, 2001, San Diego, [California] USA
- Format:
- Book
- Series:
- SPIE proceedings series Soft X-ray and EUV imaging systems II
- Language:
- English
- Subjects (All):
- X-ray optics--Industrial applications--Congresses.
- X-ray optics.
- Grenz rays--Industrial applications--Congresses.
- Grenz rays.
- Ultraviolet radiation--Congresses.
- Ultraviolet radiation.
- X-rays--Congresses.
- X-rays.
- Place of Publication:
- [Place of publication not identified] SPIE 2001
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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