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Sensors, cameras, and systems for industrial/scientific applications X : 20-22 January 2009, San Jose, California, United States / Erik Bodegom, Valérie Nguyen, editors ; sponsored ... by IS&T--the Society for Imaging Science and Technology, [and] SPIE.
- Format:
- Book
- Series:
- Electronic Imaging Science and Technology Symposium. Proceedings of Electronic Imaging Science and Technology.
- Proceedings of SPIE, 0277-786X ; v. 7249
- Proceedings of electronic imaging science and technology
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 7249.
- Language:
- English
- Subjects (All):
- Charge coupled devices--Congresses.
- Charge coupled devices.
- Metal oxide semiconductors, Complementary--Congresses.
- Metal oxide semiconductors, Complementary.
- Detectors--Scientific applications--Congresses.
- Detectors.
- Detectors--Industrial applications--Congresses.
- Charge coupled devices--Scientific applications--Congresses.
- Metal oxide semiconductors, Complementary--Industrial applications--Congresses.
- Detectors--Congresses.
- Physical Description:
- 1 online resource (1 v. (various pagings) ) ill. ;
- Place of Publication:
- Bellingham, Wash. : SPIE ; Springfield, Va. : IS&T, 2009.
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- Includes bibliographical references.
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