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Optical measurement systems for industrial inspection VI : 15-18 June 2009, Munich, Germany
- Format:
- Book
- Series:
- Proceedings of SPIE Optical measurement systems for industrial inspection VI
- Language:
- English
- Subjects (All):
- Quality control--Optical methods--Congresses.
- Quality control.
- Optical instruments--Industrial applications--Congresses.
- Optical instruments.
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Place of Publication:
- [Place of publication not identified] SPIE 2009
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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