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Sensors, cameras, and systems for industrial/scientific applications XI : 19-21 January 2010, San Jose, California, United States
- Format:
- Book
- Conference/Event
- Conference Name:
- Electronic Imaging Science and Technology Symposium (2010 : San Jose, Calif.)
- Series:
- Proceedings IS&T/SPIE Electronic Imaging Science and Technology Sensors, cameras, and systems for industrial/scientific applications XI
- Language:
- English
- Subjects (All):
- Charge coupled devices--Scientific applications--Congresses.
- Charge coupled devices.
- Metal oxide semiconductors, Complementary--Industrial applications--Congresses.
- Metal oxide semiconductors, Complementary.
- Detectors--Congresses.
- Detectors.
- Place of Publication:
- [Place of publication not identified] SPIE 2010
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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