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Optical test and measurement technology and equipment : 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 2-5 November, 2005, Xian, China

SPIE Digital Library Proceedings Available online

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Format:
Book
Conference/Event
Author/Creator:
International Symposium on Advanced Optical Manufacturing and Testing Technologies, Corporate Author.
Contributor:
Hou, Xun, Contributor.
Society of Photo Optical Instrumentation Engineers, Content Provider.
Zhongguo guang xue xue hui, Content Provider.
Guo jia zi ran ke xue ji jin wei yuan hui (China), Content Provider.
Conference Name:
International Symposium on Advanced Optical Manufacturing and Testing Technologies
Series:
SPIE proceedings series Optical test and measurement technology and equipment
Language:
English
Subjects (All):
Optical materials--Testing--Congresses.
Optical materials.
Optical measurements--Congresses.
Optical measurements.
Measurement--Congresses.
Measurement.
Place of Publication:
[Place of publication not identified] SPIE 2006
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
0-8194-6189-X

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