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Design, manufacturing, and testing of micro- and nano-optical devices and systems : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China / Sen Han, Masaomi Kameyama, Xiangang Luo, editors ; sponsored by COS--the Chinese Optical Society (China), [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China), [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), [and] National Natural Science Foundation of China (China).

SPIE Digital Library Proceedings Available online

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Format:
Book
Conference/Event
Author/Creator:
International Symposium on Advanced Optical Manufacturing and Testing Technologies, Corporate Author.
Contributor:
Luo, Xiangang, Contributor.
Kameyama, Masaomi, Contributor.
Han, Sen, Contributor.
China, Content Provider.
Zhongguo guang xue xue hui, Content Provider.
Guo jia zi ran ke xue ji jin wei yuan hui (China), Content Provider.
Zhongguo ke xue yuan, Content Provider.
Conference Name:
International Symposium on Advanced Optical Manufacturing and Testing Technologies (4th : 2008 : Chengdu, China)
International Symposium on Advanced Optical Manufacturing and Testing Technologies
Series:
Proceedings of SPIE--the International Society for Optical Engineering ; v. 7284.
Proceedings of SPIE, 0277-786X ; v. 7284
Language:
English
Subjects (All):
Optical instruments--Design and construction--Congresses.
Optical instruments.
Optical instruments--Testing--Congresses.
Optoelectronic devices--Design and construction--Congresses.
Optoelectronic devices.
Optoelectronic devices--Testing--Congresses.
Physical Description:
1 online resource (1 v. (various pagings) ) ill. ;
Other Title:
Fourth International Symposium on Advanced Optical Manufacturing and Testing Technologies
Place of Publication:
Bellingham, Wash. : SPIE, 2009.
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph
ISBN:
0-8194-7544-0

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