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Design, manufacturing, and testing of micro- and nano-optical devices and systems : 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies : 19-21 November 2008, Chengdu, China / Sen Han, Masaomi Kameyama, Xiangang Luo, editors ; sponsored by COS--the Chinese Optical Society (China), [and] IOE--the Institute of Optics and Electronics, CAS (China) ; technical cosponsor, SPIE ; cosponsoring organizations, State Key Laboratory of Optical Technology for Microfabrication (China), [and] SOS--Sichuan Optical Society (China) ; cooperating organization, Committee of Optical Manufacturing Technology, COS (China) ; supporting organizations, Ministry of Science and Technology of China (China), Chinese Academy of Sciences (China), [and] National Natural Science Foundation of China (China).
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on Advanced Optical Manufacturing and Testing Technologies, Corporate Author.
- Conference Name:
- International Symposium on Advanced Optical Manufacturing and Testing Technologies (4th : 2008 : Chengdu, China)
- International Symposium on Advanced Optical Manufacturing and Testing Technologies
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; v. 7284.
- Proceedings of SPIE, 0277-786X ; v. 7284
- Language:
- English
- Subjects (All):
- Optical instruments--Design and construction--Congresses.
- Optical instruments.
- Optical instruments--Testing--Congresses.
- Optoelectronic devices--Design and construction--Congresses.
- Optoelectronic devices.
- Optoelectronic devices--Testing--Congresses.
- Physical Description:
- 1 online resource (1 v. (various pagings) ) ill. ;
- Other Title:
- Fourth International Symposium on Advanced Optical Manufacturing and Testing Technologies
- Place of Publication:
- Bellingham, Wash. : SPIE, 2009.
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- ISBN:
- 0-8194-7544-0
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