1 option
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
- Format:
- Book
- Series:
- Proceedings of SPIE Scanning microscopies 2011
- Language:
- English
- Subjects (All):
- Scanning electron microscopes--Congresses.
- Scanning electron microscopes.
- Other Title:
- Scanning Microscopies 2011
- Place of Publication:
- [Place of publication not identified] SPIE 2011
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.