2 options
Imaging techniques for testing and inspection : 1-2 February 1972, Los Angeles, United States / editors, John C. Urbach, Byron B. Brenden, Robert Apprahamian ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 0029.
- Proceedings of SPIE ; Volume 0029
- Language:
- English
- Subjects (All):
- Imaging systems--Congresses.
- Imaging systems.
- Nondestructive testing--Congresses.
- Nondestructive testing.
- Physical Description:
- 1 online resource (viii, 150 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1972.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 10, 2018).
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