1 option
Design and process integration for microelectronic manufacturing II [sic] : 26-27 February 2004, Santa Clara, California, USA
- Format:
- Book
- Series:
- SPIE proceedings series Design and process integration for microelectronic manufacturing II [sic]
- Language:
- English
- Subjects (All):
- Integrated circuits--Design and construction--Congresses.
- Integrated circuits.
- Integrated circuits--Defects--Analysis--Congresses.
- Semiconductors--Design and construction--Congresses.
- Semiconductors.
- Semiconductor wafers--Defects--Analysis--Congresses.
- Semiconductor wafers.
- Microelectronics industry--Quality control--Congresses.
- Microelectronics industry.
- Quality control--Congresses.
- Quality control.
- Place of Publication:
- [Place of publication not identified] SPIE 2004
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.