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Data analysis and modeling for process control II : 3-4 March, 2005, San Jose, California, USA
- Format:
- Book
- Series:
- Proceedings of SPIE Data analysis and modeling for process control II
- Language:
- English
- Subjects (All):
- Manufacturing processes--Mathematical models--Congresses.
- Manufacturing processes--Automatic control--Congresses.
- Intelligent control systems--Mathematical models--Congresses.
- Process control--Mathematical models--Congresses.
- Place of Publication:
- [Place of publication not identified] SPIE 2005
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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