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Computer vision and image analysis of art : 18-19 January 2010, San Jose, California, United States
- Format:
- Book
- Series:
- Proceedings of SPIE Computer vision and image analysis of art
- Language:
- English
- Subjects (All):
- Computer vision--Congresses.
- Computer vision.
- Image analysis--Testing--Congresses.
- Image analysis.
- Image processing--Congresses.
- Image processing.
- Image processing (Digitial techniques)--Congresses.
- Image processing (Digitial techniques).
- Image reconstruction--Congresses.
- Image reconstruction.
- Materials.
- Place of Publication:
- [Place of publication not identified] SPIE 2010
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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