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Process control and inspection for industry : optics and optoelectronic inspection and control techniques, applications, and instruments : 8-10 November 2000, Beijing, China / editors, Shulian Zhang, Wei Gao ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 4222.
- Proceedings of SPIE ; Volume 4222
- Language:
- English
- Subjects (All):
- Process control--Automation--Congresses.
- Process control.
- Manufacturing processes--Automation--Congresses.
- Manufacturing processes.
- Physical Description:
- 1 online resource (222 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2000.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 3, 2018).
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