My Account Log in

1 option

Advances in Pattern Recognition : Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 - September 1, 2000 Proceedings / edited by Francesc J. Ferri, Jose M. Inesta, Adnan Amin, Pavel Pudil.

LIBRA Q341 .P7 2004
Loading location information...

Available from offsite location This item is stored in our repository but can be checked out.

Log in to request item
Format:
Book
Contributor:
Ferri, Francesc J., editor.
Inesta, Jose M., editor.
Amin, Adnan, 1950- editor.
Pudil, Pavel, editor.
SpringerLink (Online service)
Series:
Computer Science (Springer-11645)
Lecture notes in computer science 0302-9743 ; 1876.
Lecture Notes in Computer Science, 0302-9743 ; 1876
Language:
English
Subjects (All):
Pattern perception.
Optical data processing.
Application software.
Computer graphics.
Artificial intelligence.
Pattern Recognition.
Image Processing and Computer Vision.
Computer Applications.
Computer Graphics.
Artificial Intelligence.
Local Subjects:
Pattern Recognition.
Image Processing and Computer Vision.
Computer Applications.
Computer Graphics.
Artificial Intelligence.
Physical Description:
1 online resource (XXXVI, 904 pages).
Edition:
First edition 2000.
Contained In:
Springer eBooks
Place of Publication:
Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2000.
System Details:
text file PDF
Summary:
This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.
Contents:
Invited Papers
Pierre Devijver Lecture
Hybrid and Combined Methods
Applications
Document Image Analysis
Grammar and Language Methods
Structural Matching
Graph-Based Methods
Shape Analysis
SSPR Poster Session
Clustering and Density Estimation
Object Recognition
General Methodology I
General Methodology II
Feature Extraction and Selection
SPR Poster Session.
Other Format:
Printed edition:
ISBN:
978-3-540-44522-7
9783540445227
Access Restriction:
Restricted for use by site license.

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account