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VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers / edited by Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh.
- Format:
- Book
- Series:
- Computer Science (Springer-11645)
- Communications in computer and information science 1865-0929 ; 711.
- Communications in Computer and Information Science, 1865-0929 ; 711
- Language:
- English
- Subjects (All):
- Computer hardware.
- Microprocessors.
- Computer networks.
- Computer Hardware.
- Processor Architectures.
- Computer Communication Networks.
- Local Subjects:
- Computer Hardware.
- Processor Architectures.
- Computer Communication Networks.
- Physical Description:
- 1 online resource (XXI, 815 pages) : 486 illustrations.
- Edition:
- First edition 2017.
- Contained In:
- Springer eBooks
- Place of Publication:
- Singapore : Springer Singapore : Imprint: Springer, 2017.
- System Details:
- text file PDF
- Summary:
- This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
- Contents:
- Digital design
- Analog/mixed signal
- VLSI testing
- Devices and technology
- VLSI architectures
- Emerging technologies and memory
- System design
- Low power design and test
- RF circuits
- Architecture and CAD
- Design verification.
- Other Format:
- Printed edition:
- ISBN:
- 978-981-10-7470-7
- 9789811074707
- Access Restriction:
- Restricted for use by site license.
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