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Ellipsometry : Principles and Techniques for Materials Characterization / edited by Faustino Wahaia.

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Format:
Book
Author/Creator:
Faustino Wahaia
Contributor:
Wahaia, Faustino, editor.
Language:
English
Subjects (All):
Ellipsometry.
Physical Description:
1 online resource (160 pages) : illustrations
Other Title:
Ellipsometry
Place of Publication:
IntechOpen 2017
Rijeka, Croatia : IntechOpen, 2017.
Language Note:
English
Summary:
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
Notes:
Description based on: online resource; title from PDF information screen (InTech, viewed October 10, 2022).
Includes bibliographical references.
ISBN:
9789535145929
9535145924
9789535136248
9535136240

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