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Semiconductor packaging : materials interaction and reliability / Andrea Chen, Randy Hsiao-Yu Lo.

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Format:
Book
Author/Creator:
Chen, Andrea.
Contributor:
Chen, Andrea.
Lo, Randy.
Language:
English
Subjects (All):
Semiconductors--Reliability.
Semiconductors.
Electronic packaging--Reliability.
Electronic packaging.
Materials science.
Electrical engineering.
Physical Description:
1 online resource (208 p.)
Edition:
1st edition
Place of Publication:
Boca Raton : CRC Press, 2011.
Language Note:
English
System Details:
text file
Summary:
In semiconductor manufacturing, understanding how various materials behave and interact is critical to making a reliable and robust semiconductor package. Semiconductor Packaging: Materials Interaction and Reliability provides a fundamental understanding of the underlying physical properties of the materials used in a semiconductor package. The book focuses on an important step in semiconductor manufacturing package assembly and testing. It covers the basics of material properties and explains how to determine which behaviors are important to package performance. The authors also discuss how the properties of packaging materials interact with each another and explore how to maximize the performance of these materials in regard to package integrity and reliability.By tying together the disparate elements essential to a semiconductor package, this easy-to-read book shows how all the parts fit and work together to provide durable protection for the integrated circuit chip within as well as a means for the chip to communicate with the outside world-- Provided by publisher.
Contents:
Front Cover; Contents; Preface; Authors; Partial list of abbreviations, acronyms, and symbols; Chapter 1: History and background; Chapter 2: Package form factors and families; Chapter 3: Surface-mount technology; Chapter 4: Other packaging needs; Chapter 5: Reliability testing; Chapter 6: Polymers; Chapter 7: Metals; Chapter 8: Ceramics and glasses; Chapter 9: Trends and challenges; Chapter 10: Light-emitting diodes; Glossary; Appendix A: Analytical tools; Appendix B: Destructive tools and tests; Back Cover
Notes:
Description based upon print version of record.
Includes bibliographical references.
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International CC BY-NC-ND 4.0 https://creativecommons.org/licenses/by-nc-nd/4.0/legalcode
Description based on print version record; resource not viewed.
ISBN:
9786613274601
9781000218619
1000218619
9780429063350
0429063350
9781283274609
1283274604
9781439862070
1439862079
OCLC:
756484227
Access Restriction:
Unrestricted online access

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