Immittance spectroscopy : applications to material systems / Mohammad A. Alim.

Format:

Book

Author/Creator:

Alim, Mohammad A., author.

Language:

English

Subjects (All):

Impedance spectroscopy.

Physical Description:

1 online resource (417 pages)

Edition:

1st ed.

Place of Publication:

Hoboken, New Jersey ; Beverly, Massachusetts : Scrivener Publishing : Wiley, 2017.

Summary:

This book emphasizes the use of four complex plane formalisms (impedance, admittance, complex capacitance, and modulus) in a simultaneous fashion. The purpose of employing these complex planes for handling semicircular relaxation using a single set of measured impedance data ( ac small-signal electrical data ) is highly underscored. The current literature demonstrates the importance of template version of impedance plot whereas this book reflects the advantage of using concurrent four complex plane plots for the same data. This approach allows extraction of a meaningful equivalent circuit model attributing to possible interpretations via potential polarizations and operative mechanisms for the investigated material system. Thus, this book supersedes the limitations of the impedance plot, and intends to serve a broader community of scientific and technical professionals better for their solid and liquid systems. This book addresses the following highlighted contents for the measured data but not limited to the: - (1) Lumped Parameter/Complex Plane Analysis (LP/CPA) in conjunction with the Bode plots; (2) Equivalent circuit model (ECM) derived from the LP/CPA; (3) Underlying Operative Mechanisms along with the possible interpretations; (4) Ideal (Debye) and non-ideal (non-Debye) relaxations; and (5) Data-Handling Criteria (DHC) using Complex Nonlinear Least Squares (CNLS) fitting procedures.

Contents:

Intro

Title page

Copyright page

Dedication

Background of this Book

Acknowledgments

Chapter 1: Introduction to Immittance Spectroscopy

1.1 Basic Definition and Background

1.2 Scope and Limitation

1.3 Applications of the Immittance Studies to Various Material Systems

1.4 Concept of the Linear Circuit Elements: Resistance, Capacitance, and Inductance

1.5 Concept of Impedance, Admittance, Complex Capacitance, and Modulus

1.6 Immittance Functions

1.7 Series Resonant Circuit

1.8 Parallel Resonant Circuit

1.9 Capacitance and Inductance in Alternating Current

Problems

References

Chapter 2: Basics of Solid State Devices and Materials

2.1 Overview of the Fundamentals of Physical Electronics

2.2 Basics of Semiconductors

2.3 Single-Crystal and Polycrystal Materials

2.4 SCSJ and MPCHPH Systems

2.5 Representation of the Competing Phenomena

2.6 Effect of Normalization of the Electrical Parameters

Chapter 3: Dielectric Representation and Operative Mechanisms

3.1 Dielectric Constant of Materials: Single Crystals and Polycrystals

3.2 Dielectric Behavior of Materials: Single Crystals and Polycrystals

3.3 Origin of Frequency Dependence

3.4 Effect of Polarization

3.5 Equivalent Circuit Representation of the Mechanisms and Processes

3.6 Defects and Traps

3.7 Point Defects and Stoichiometric Defects

3.8 Leaky Systems

Chapter 4: Ideal Equivalent Circuits and Models

4.1 Concept of Equivalent Circuit

4.2 Simple and Basic Circuits in Complex Planes: R, C, R-C Series, and R-C Parallel

4.3 Debye Circuits: Single Relaxation

4.4 Duality of the Equivalent Circuits: Multiple Circuits for a Single Plane

4.5 Duality of Equivalent Circuits between Z*- and M*-Planes for Relaxations without Intercept.

4.6 Duality of Equivalent Circuits between Y*- and C*-Planes for Relaxations without Intercept

4.7 Duality of Equivalent Circuits for Simultaneous Z*-, Y*-, C*-, and M*-Planes' Relaxations

4.8 Proposition of Equivalent Circuit: Polycrystalline Grains and Grain Boundaries

Chapter 5: Debye and Non-Debye Relaxations

5.1 Ideal Systems

5.2 Non-Ideal Systems

5.3 Non-Ideal Systems Implying Distributed Time Constants

5.4 D-C Representation, Depression Parameter, and Equivalent Circuit: Conventional Domain

5.5 Depression Parameter Based on ωτpeak = 1: Complex Domain

5.6 Optimization of ZHF: Complex Domain

5.7 Depression Parameter β Based on ωτpeak = 1

5.8 Feature of the Depression Parameter β Based on ωτ ≠ 1

5.9 Analysis of the Havriliak-Negami Representation

5.10 Geometrical Interpretation of H-N Relaxation at the Limiting Case

5.11 Extraction of the Relaxation Time τ and the H-N Depression Parameters α and β

5.12 Checking Generalized Depression Parameter β when α is Real

5.13 Checking Generalized Depression Parameter α when β is Real

5.14 Effect of α and β on the H-N Distribution Function

5.15 Meaning of the Depression Parameters α and β

5.16 Relaxation Function with Respect to the Depression Parameters α and β

Chapter 6: Modeling and Interpretation of the Data

6.1 Equivalent Circuit Model for the Single Complex Plane (SCP) Representation

6.2 Models and Circuits

6.3 Nonconventional Circuits

6.4 Multiple Equivalent Circuits for Multiple Relaxations in a Single Complex Plane

6.5 Single Equivalent Circuit for Multiple Complex Planes

6.6 Equivalent Circuit for Resonance

6.7 Single Equivalent Circuit from Z*- and M*-Planes

6.8 Temperature and Bias Dependence of the Equivalent Circuit Modeling.

6.9 Equivalent Circuit: Zinc Oxide (ZnO) Based Varistors

6.10 Equivalent Circuit: Lithium Niobate (LiNbO3) Single Crystal

6.11 Equivalent Circuit: Polycrystalline Yttria (Y2O3)

6.12 Equivalent Circuit: Polycrystalline Calcium Zirconate (CaZrO3)

6.13 Equivalent Circuit: Polycrystalline Calcium Stannate (CaSnO3)

6.14 Equivalent Circuit: Polycrystalline Titanium Dioxide (TiO2)

6.15 Equivalent Circuit: Multi-Layered Thermoelectric Device (Alternate SiO2/SiO2+Ge Thin-Film)

6.16 Equivalent Circuit: Polycrystalline Tungsten Oxide (WO3)

6.17 Equivalent Circuit: Biological Material - E. Coli Bacteria

Chapter 7: Data-Handling and Analyzing Criteria

7.1 Acquisition of the Immittance Data

7.2 Lumped Parameter/Complex Plane Analysis (LP/CPA)

7.3 Spectroscopic Analysis (SA)

7.4 Bode Plane Analysis (BPA)

7.5 Misrepresentation of the Measured Data

7.6 Misinterpretation of the Bode Plot: Equivalent Circuit

Chapter 8: Liquid Systems

8.1 Non-Crystalline Systems: Liquids

8.2 Warburg and Faradaic Impedances

8.3 Constant Phase Element (CPE)

8.4 Biological Liquid: E. Coli Bacteria

Chapter 9: Case Studies

9.1 Analysis of the Measured Data: Aspects of Data-Handling/Analyzing Criteria

9.2 Case 1: Proper Physical Geometrical Factors

9.3 Case 2: Improper Normalization

9.4 Case 3: Effect of Electrode and Lead Wire

9.5 Case 4: Identification of Contributions to the Terminal Immittance

9.6 Case 5: Use of Proper Unit

9.7 Case 6: Demonstration of the Invalid Plot

9.8 Case 7: Obscuring Frequency Dependence

9.9 Case 8: Misnomer Nomenclature for the Complex Plane Plot

9.10 Case 9: Extraction of Equivalent Circuit from the Straight Line or the Non-Relaxation Curve

References.

Chapter 10: Analysis of the Complicated Mott-Schottky Behavior

10.1 Capacitance - Voltage (C-V) Measurement

10.2 The Mott-Schottky Plot

10.3 Arbitrary Measurement Frequency and Construction of the Deceiving Mott-Schottky Plot

10.4 Frequency-Independent Representation

10.5 Extraction of the Device-Related Parameters

Chapter 11: Analysis of the Measured Data

11.1 Introduction and Background of the Immittance Data Analysis

11.2 Measurement of the Immittance Data and Complex Plane Analysis

11.3 Nonlinear Least Squares Estimation

11.4 Complex Nonlinear Least Squares (CNLS) Fitting of the Data

11.5 Graphical User Interface Implementation of the Nonlinear Least Square Procedures: Implementation of CNLS using MATLAB

11.6 Effect of Fitting Procedure, Measurement Noise, and Solution Algorithm on the Estimated Parameters

11.7 Case Studies: CNLS Fitting of the Measured Data in the Complex Planes

11.8 Summary

Chapter 12: Appendices

12.1 Appendix - A: Sample Input Data for the R-C Parallel Circuit

12.2 Appendix - B: R-C Parallel Circuit Data Analysis Output in Z*-Plane

12.3 Appendix - C: R-C Parallel Circuit Data Analysis Output in M*-Plane

12.4 Appendix - D: Lithium Niobate Crystal Data Analysis Output in C*-Plane

12.5 Appendix - E: Multilayer Junction Thermoelectric Device Data Analysis Output in Y*-Plane

Index

End User License Agreement.

Notes:

Includes index.

Description based on print version record.

ISBN:

9781119185420

1119185424

9781119185406

1119185408

9781119185413

1119185416

OCLC:

1011555236