Proceedings.

Format:

Conference/Event

Journal/Periodical

Contributor:

IEEE Computer Society. Test Technology Technical Committee.

IEEE Xplore (Online service)

Conference Name:

Asian Test Symposium.

Language:

English

Subjects (All):

Electronic circuits--Testing--Congresses.

Electronic circuits.

Electronic digital computers--Circuits--Testing--Congresses.

Electronic digital computers.

Fault-tolerant computing--Congresses.

Fault-tolerant computing.

Electronic circuits--Testing.

Electronic digital computers--Circuits--Testing.

Genre:

Periodicals.

Conference papers and proceedings.

Physical Description:

Annual

Began with 1st (Nov. 26-27, 1992).

Other Title:

ATS ... proceedings 1992-1993

Volumes for 1993-1996 have title: Proceedings of the ... Asian Test Symposium

Place of Publication:

Los Alamitos, Calif. : IEEE Computer Society Press, ©1992-

Notes:

Sponsored by: IEEE Computer Society Test Technology Technical Committee and various local groups.

23th (Nov. 16-19, 2014).

Constituent Unit:

Test Symposium, 1996., Proceedings of the Fifth Asian

2006 15th Asian Test Symposium

Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

Test Symposium, 1999. (ATS '99) Proceedings. Eighth Asian

Proceedings of the Ninth Asian Test Symposium

Proceedings 10th Asian Test Symposium

Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian

2003 Test Symposium

13th Asian Test Symposium

14th Asian Test Symposium (ATS'05)

ISSN:

2377-5386

OCLC:

232333621