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IEEE International Reliability Physics Symposium proceedings / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
- Format:
- Conference/Event
- Journal/Periodical
- Conference Name:
- International Reliability Physics Symposium.
- Standardized Title:
- IEEE International Reliability Physics Symposium proceedings (Online)
- Language:
- English
- Subjects (All):
- Electronic apparatus and appliances--Reliability--Congresses.
- Electronic apparatus and appliances.
- Electronic apparatus and appliances--Testing--Congresses.
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Electronic apparatus and appliances--Reliability.
- Electronic apparatus and appliances--Testing.
- Integrated circuits--Reliability.
- Integrated circuits--Testing.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- Annual
- Print began with 35th (1997).
- Other Title:
- Online issue header for 1998-1999, 2003- has title: Reliability Physics Symposium proceedings ... annual ... IEEE International
- Online issue header for 2002 has title: Reliability Physics Symposium proceedings ... annual
- Continues:
- IEEE international reliability physics proceedings
- Place of Publication:
- Piscataway, N.J. : The Societies, ©1997-
- System Details:
- Mode of access: World Wide Web.
- Vols. for 2005- have separate URL's.
- Notes:
- Description based on: 36th (1998); title from PDF title page (IEEE Xplore, viewed June 5, 2006).
- Latest issue consulted: 43rd (2005); IEEE Xplore, viewed June 5, 2006.
- ISSN:
- 1541-7026
- OCLC:
- 69862613
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