1 option
Reliability by Design 9. ITG/GMM/GI-Symposium : 18-20 September 2017, Cottbus, Germany / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Conference/Event
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author.
- Conference Name:
- Fachtagung "Zuverlässigkeit und Entwurf" (9th : 2017 : Cottbus, Germany), author.
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Design and construction--Congresses.
- Physical Description:
- 1 online resource (8 pages)
- Place of Publication:
- Berlin, Germany : VDE Verlag, 2017.
- Language Note:
- English and German, with some summaries in both languages.
- Notes:
- Description based on: online resource; title from title screen (IEEE Xplore, viewed May 29, 2020).
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.