1 option
... East-West Design and Test Symposium.
- Format:
- Conference/Event
- Journal/Periodical
- Conference Name:
- IEEE East-West Design & Test Symposium.
- Language:
- English
- Subjects (All):
- Computer engineering--Congresses.
- Computer engineering.
- Electronic circuit design--Congresses.
- Electronic circuit design.
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Electronic digital computers--Circuits--Testing--Congresses.
- Electronic digital computers.
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Electronic circuits--Testing.
- Electronic digital computers--Circuits--Testing.
- Integrated circuits--Testing.
- Genre:
- Periodicals.
- Conference papers and proceedings.
- Physical Description:
- Annaul
- Print began in 2003?
- Other Title:
- EWDTS ...
- Some issues may have title: Proceedings
- Volume for 2010 have title: Proceedings of IEEE East-West Disign & Test Symposium
- Proceedings of IEEE East-West Disign and Test Symposium
- IEEE East-West Design & Test International Symposium
- Place of Publication:
- Piscataway, NJ : Institute of Electrical and Electronics Engineers, Inc
- Notes:
- Description based on: 2008; title from PDF title page (IEEEXplore website, viewed on May 28, 2016)..
- Latest issue consulted: 2014 (viewed on May 28, 2016).
- ISSN:
- 2472-761X
- OCLC:
- 950750614
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