Conference record / Autotestcon.

Format:

Conference/Event

Journal/Periodical

Contributor:

Institute of Electrical and Electronics Engineers

IEEE Instrumentation and Measurement Society

IEEE Aerospace and Electronic Systems Society

Conference Name:

Autotestcon.

Standardized Title:

Conference record (Online)

Language:

English

Subjects (All):

Automatic test equipment--Congresses.

Automatic test equipment.

Maintainability (Engineering)--Congresses.

Maintainability (Engineering).

Avionics--Congresses.

Avionics.

Genre:

Conference papers and proceedings.

Physical Description:

Annual

Print began with 1995; ceased with 1996.

Other Title:

Title on IEEE website: Systems Readiness: Test Technology for the 21st Century. Conference Record

IEEE Autotestcon

Place of Publication:

[New York, N.Y.] : Institute of Electrical and Electronics Engineers

System Details:

Mode of access: World Wide Web.

Notes:

Each vol. has also a distinctive title.

Sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society.

Description based on print version record.

Latest issue consulted: (8-10 Aug. 2005) (viewed IEEEexplore website Sept. 29, 2005).

Constituent Unit:

AUTOTESTCON '96, Test Technology and Commercialization. Conference Record

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)

Proceedings AUTOTESTCON 2004

ISSN:

1558-4550

OCLC:

61124036