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Proceedings of the 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) : 18-21 July 2016, Marina Bay Sand, Singapore / sponsored by IEEE [and six others].
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium on the Physical & Failure Analysis of Integrated Circuits (23rd : 2016 : Marina Bay, Singapore)
- Language:
- English
- Subjects (All):
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Testing--Congresses.
- Physical Description:
- 1 online resource (111 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2016.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed March 14, 2020).
- ISBN:
- 1-4673-8259-0
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