An introduction to the event-related potential technique / Steven J. Luck.

Format:

Book

Author/Creator:

Luck, Steven J. (Steven John), 1963- author.

Language:

English

Subjects (All):

Evoked potentials (Electrophysiology).

Genre:

Electronic books.

Physical Description:

1 online resource (417 pages): illustrations

Edition:

Second edition.

Place of Publication:

Cambridge, Massachusetts : The MIT Press, 2014.

System Details:

text file

Summary:

The event-related potential (ERP) technique, in which neural responses to specific events are extracted from the EEG, provides a powerful noninvasive tool for exploring the human brain. This volume describes practical methods for ERP research along with the underlying theoretical rationale. It offers researchers and students an essential guide to designing, conducting, and analyzing ERP experiments. This second edition has been completely updated, with additional material, new chapters, and more accessible explanations. Freely available supplementary material, including several online-only chapters, offer expanded or advanced treatment of selected topics. The first half of the book presents essential background information, describing the origins of ERPs, the nature of ERP components, and the design of ERP experiments. The second half of the book offers a detailed treatment of the main steps involved in conducting ERP experiments, covering such topics as recording the EEG, filtering the EEG and ERP waveforms, and quantifying amplitudes and latencies. Throughout, the emphasis is on rigorous experimental design and relatively simple analyses. New material in the second edition includes entire chapters devoted to components, artifacts, measuring amplitudes and latencies, and statistical analysis; updated coverage of recording technologies; concrete examples of experimental design; and many more figures. Online chapters cover such topics as overlap, localization, writing and reviewing ERP papers, and setting up and running an ERP lab. Book jacket.

Contents:

1 A Broad Overview of the Event-Related Potential Technique 1

2 A Closer Look at ERPs and ERP Components 35

3 Overview of Common ERP Components 71

4 The Design of ERP Experiments 119

5 Basic Principles of ERP Recording 147

6 Artifact Rejection and Correction 185

7 Basics of Fourier Analysis and Filtering 219

8 Baseline Correction, Averaging, and Time-Frequency Analysis 249

9 Quantifying ERP Amplitudes and Latencies 283

10 Statistical Analysis 309.

Notes:

Includes bibliographical references and index.

Description based on print version record.

Local Notes:

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.

Other Format:

Print version: Luck, Steven J. (Steven John), 1963- Introduction to the event-related potential technique.

ISBN:

9780262324052

OCLC:

881627504

Access Restriction:

Restricted for use by site license.