Quantum metrology : foundation of units and measurements. / Ernst O. Göbel and Uwe Siegner.

Format:

Book

Author/Creator:

Göbel, Ernst O., author.

Siegner, Uwe, author.

Language:

English

Subjects (All):

Metrology.

Quantum measure theory.

Quantum theory.

Physical Description:

1 online resource (242 p.)

Edition:

1st ed.

Place of Publication:

Weinheim, Germany : Wiley-VCH, 2015.

Language Note:

English

Summary:

The International System of Units (SI) is the world's most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)). The system is changing though, units and unit definitions are modified through international agreements as the technology of measurement progresses, and as the precision of measurements improves. The SI is now being redefined based on constants of nature and their realization b

Contents:

Cover; Title Page; Copyright; Contents; Foreword; Preface; List of Abbreviations; Color Plates; Chapter 1 Introduction; References; Chapter 2 Some Basics; 2.1 Measurement; 2.1.1 Limitations of Measurement Uncertainty; 2.1.1.1 The Fundamental Quantum Limit; 2.1.1.2 Noise; 2.2 The SI (Système International d'Unités); 2.2.1 The Second: Unit of Time; 2.2.2 The Meter: Unit of Length; 2.2.3 The Kilogram: Unit of Mass; 2.2.4 The Ampere: Unit of Electrical Current; 2.2.5 The Kelvin: Unit of Thermodynamic Temperature; 2.2.6 The Mole: Unit of Amount of Substance

2.2.7 The Candela: Unit of Luminous IntensityReferences; Chapter 3 Laser Cooling, Atomic Clocks, and the Second; 3.1 Techniques for Laser Cooling; 3.1.1 Doppler Cooling, Optical Molasses, and Magneto-Optical Traps; 3.1.2 Cooling Below the Doppler Limit; 3.1.3 Optical Lattices; 3.1.4 Ion Traps; 3.2 The Cs Fountain Clock; 3.3 Optical Clocks; 3.3.1 Femtosecond Frequency Combs; 3.3.2 Neutral Atom Clocks; 3.3.3 Atomic Ion Clocks; 3.3.4 Possible Variation of the Fine-Structure Constant, α; References; Chapter 4 Superconductivity, Josephson Effect, and Flux Quanta

4.1 Josephson Effect and Quantum Voltage Standards4.1.1 Brief Introduction to Superconductivity; 4.1.2 Basics of the Josephson Effect; 4.1.2.1 AC and DC Josephson Effect; 4.1.2.2 Mixed DC and AC Voltages: Shapiro Steps; 4.1.3 Basic Physics of Real Josephson Junctions; 4.1.4 Josephson Voltage Standards; 4.1.4.1 General Overview: Materials and Technology of Josephson Arrays; 4.1.4.2 DC Josephson Voltage Standards: The Conventional Volt; 4.1.4.3 Programmable Binary AC Josephson Voltage Standards; 4.1.4.4 Pulse-Driven AC Josephson Voltage Standards

4.1.4.5 Applications of AC Josephson Voltage Standards4.2 Flux Quanta and SQUIDs; 4.2.1 Superconductors in External Magnetic Fields; 4.2.1.1 Meissner-Ochsenfeld Effect; 4.2.1.2 Flux Quantization in Superconducting Rings; 4.2.1.3 Josephson Junctions in External Magnetic Fields and Quantum Interference; 4.2.2 Basics of SQUIDs; 4.2.3 Applications of SQUIDs in Measurement; 4.2.3.1 Real DC SQUIDs; 4.2.3.2 SQUID Magnetometers and Magnetic Property Measurement Systems; 4.2.3.3 Cryogenic Current Comparators: Current and Resistance Ratios; 4.2.3.4 Biomagnetic Measurements

4.2.4 Traceable Magnetic Flux Density MeasurementsReferences; Chapter 5 Quantum Hall Effect; 5.1 Basic Physics of Three- and Two-Dimensional Semiconductors; 5.1.1 Three-Dimensional Semiconductors; 5.1.2 Two-Dimensional Semiconductors; 5.2 Two-Dimensional Electron Systems in Real Semiconductors; 5.2.1 Basic Properties of Semiconductor Heterostructures; 5.2.2 Epitaxial Growth of Semiconductor Heterostructures; 5.2.3 Semiconductor Quantum Wells; 5.2.4 Modulation Doping; 5.3 The Hall Effect; 5.3.1 The Classical Hall Effect; 5.3.1.1 The Classical Hall Effect in Three Dimensions

5.3.1.2 The Classical Hall Effect in Two Dimensions

Notes:

Description based upon print version of record.

Includes bibliographical references at the end of each chapters and index.

Description based on online resource; title from PDF title page (ebrary, viewed July 13, 2015).

ISBN:

9783527680924

3527680926

9783527680887

3527680888

9783527680894

3527680896

OCLC:

911386051