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ICMTS : 2019 IEEE 32nd International Conference on Microelectronic Test Structures : March 18-21, Kitakyushu International Conference Center, Kitakyushu City, Fukuoka Prefecture, Japan / Institute of Electrical and Electronics Engineers.
- Format:
- Book
- Conference/Event
- Author/Creator:
- Institute of Electrical and Electronics Engineers, author.
- Conference Name:
- IEEE International Conference on Microelectronic Test Structures (32nd : 2019 : Kitakyūshū-shi, Japan)
- Language:
- English
- Subjects (All):
- Integrated circuits--Testing--Congresses.
- Integrated circuits.
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Physical Description:
- 1 online resource (xiv, 199 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2019.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed May 16, 2020).
- ISBN:
- 1-7281-1466-7
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