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Foundations of software testing
- Format:
- Book
- Author/Creator:
- Mathur, Aditya, Author.
- Series:
- Always learning
- Language:
- English
- Subjects (All):
- Computer software--Testing.
- Computer software.
- Physical Description:
- 1 online resource (1 v.) : ill.
- Edition:
- 2nd ed.
- Place of Publication:
- [Place of publication not identified] Pearson 2013
- Language Note:
- English
- System Details:
- text file
- Summary:
- This edition of
- Contents:
- Cover
- Contents
- Preface to the Second Edition
- Preface to the First Edition
- Acknowledgements
- Part I: Preliminaries
- Chapter 1: Preliminaries: Software Testing
- 1.1 Humans, Errors, and Testing
- 1.1.1 Errors, faults, and failures
- 1.1.2 Test automation
- 1.1.3 Developer and tester as two roles
- 1.2 Software Quality
- 1.2.1 Quality attributes
- 1.2.2 Reliability
- 1.3 Requirements, Behavior, and Correctness
- 1.3.1 Input domain
- 1.3.2 Specifying program behavior
- 1.3.3 Valid and invalid inputs
- 1.4 Correctness Versus Reliability
- 1.4.1 Correctness
- 1.4.2 Reliability
- 1.4.3 Operational profiles
- 1.5 Testing and Debugging
- 1.5.1 Preparing a test plan
- 1.5.2 Constructing test data
- 1.5.3 Executing the program
- 1.5.4 Assessing program correctness
- 1.5.5 Constructing an oracle
- 1.6 Test Metrics
- 1.6.1 Organizational metrics
- 1.6.2 Project metrics
- 1.6.3 Process metrics
- 1.6.4 Product metrics: generic
- 1.6.5 Product metrics: OO software
- 1.6.6 Progress monitoring and trends
- 1.6.7 Static and dynamic metrics
- 1.6.8 Testability
- 1.7 Software and Hardware Testing
- 1.8 Testing and Verification
- 1.9 Defect Management
- 1.10 Test Generation Strategies
- 1.11 Static Testing
- 1.11.1 Walkthroughs
- 1.11.2 Inspections
- 1.11.3 Software complexity and static testing
- 1.12 Model-Based Testing and Model Checking
- 1.13 Types of Testing
- 1.13.1 Classifier: C1: Source of test generation
- 1.13.2 Classifier: C2: Life cycle phase
- 1.13.3 Classifier: C3: Goal-directed testing
- 1.13.4 Classifier: C4: Artifact under test
- 1.13.5 Classifier: C5: Test process models
- 1.14 The Saturation Effect
- 1.14.1 Confidence and true reliability
- 1.14.2 Saturation region
- 1.14.3 False sense of confidence
- 1.14.4 Reducing
- 1.14.5 Impact on test process
- 1.15 Principles of Testing.
- 1.16 Tools
- Summary
- Exercises
- Chapter 2: Preliminaries:Mathematical
- 2.1 Predicates and Boolean Expressions
- 2.2 Control Flow Graph
- 2.2.1 Basic blocks
- 2.2.2 Flow graphs
- 2.2.3 Paths
- 2.2.4 Basis paths
- 2.2.5 Path conditions and domains
- 2.2.6 Domain and computation errors
- 2.2.7 Static code analysis tools and static testing
- 2.3 Execution History
- 2.4 Dominators and Post-Dominators
- 2.5 Program Dependence Graph
- 2.5.1 Data dependence
- 2.5.2 Control dependence
- 2.5.3 Call graph
- 2.6 Strings, Languages, and Regular Expressions
- 2.7 Tools
- Part II: Test Generation
- Chapter 3: Domain Partitioning
- 3.1 Introduction
- 3.2 The Test Selection Problem
- 3.3 Equivalence Partitioning
- 3.3.1 Faults targeted
- 3.3.2 Relations
- 3.3.3 Equivalence classes for variables
- 3.3.4 Unidimensional partitioning versus multidimensional partitioning
- 3.3.5 A systematic procedure
- 3.3.6 Test selection
- 3.3.7 Impact of GUI design
- 3.4 Boundary Value Analysis
- 3.5 Category-Partition Method
- 3.5.1 Steps in the category-partition method
- Chapter 4: Predicate Analysis
- 4.1 Introduction
- 4.2 Domain Testing
- 4.2.1 Domain errors
- 4.2.2 Border shifts
- 4.2.3 ON-OFF points
- 4.2.4 Undetected errors
- 4.2.5 Coincidental correctness
- 4.2.6 Paths to be tested
- 4.3 Cause-Effect Graphing
- 4.3.1 Notation used in cause-effect graphing
- 4.3.2 Creating cause-effect graphs
- 4.3.3 Decision table from cause-effect graph
- 4.3.4 Heuristics to avoid combinatorial explosion
- 4.3.5 Test generation from a decision table
- 4.4 Tests Using Predicate Syntax
- 4.4.1 A fault model
- 4.4.2 Missing or extra Boolean variable faults
- 4.4.3 Predicate constraints
- 4.4.4 Predicate testing criteria
- 4.4.5 BOR, BRO, and BRE adequate tests.
- 4.4.6 BOR constraints for non-singular expressions
- 4.4.7 Cause-effect graphs and predicate testing
- 4.4.8 Fault propagation
- 4.4.9 Predicate testing in practice
- 4.5 Tests Using Basis Paths
- 4.6 Scenarios and Tests
- Chapter 5: Test Generation from Finite State Models
- 5.1 Software Design and Testing
- 5.2 Finite State Machines
- 5.2.1 Excitation using an input sequence
- 5.2.2 Tabular representation
- 5.2.3 Properties of FSM
- 5.3 Conformance Testing
- 5.3.1 Reset inputs
- 5.3.2 The testing problem
- 5.4 A Fault Model
- 5.4.1 Mutants of FSMs
- 5.4.2 Fault coverage
- 5.5 Characterization Set
- 5.5.1 Construction of the k-equivalence partitions
- 5.5.2 Deriving the characterization set
- 5.5.3 Identification sets
- 5.6 The W-method
- 5.6.1 Assumptions
- 5.6.2 Maximum number of states
- 5.6.3 Computation of the transition cover set
- 5.6.4 Constructing Z
- 5.6.5 Deriving a test set
- 5.6.6 Testing using the W-method
- 5.6.7 The error detection process
- 5.7 The Partial W-method
- 5.7.1 Testing using the Wp-method for m - n
- 5.7.2 Testing using the Wp-method for m>n
- 5.8 The UIO-Sequence Method
- 5.8.1 Assumptions
- 5.8.2 UIO sequences
- 5.8.3 Core and non-core behavior
- 5.8.4 Generation of UIO sequences
- 5.8.5 Explanation of gen-uio
- 5.8.6 Distinguishing signatures
- 5.8.7 Test generation
- 5.8.8 Test optimization
- 5.8.9 Fault detection
- 5.9 Automata Theoretic Versus Control-Flow Based Techniques
- 5.9.1 n-switch-cover
- 5.9.2 Comparing automata theoretic methods
- 5.10 Tools
- Chapter 6: Test Generation from Combinatorial Designs
- 6.1 Combinatorial Designs
- 6.1.1 Test configuration and test set
- 6.1.2 Modeling the input and configuration spaces
- 6.2 A Combinatorial Test Design Process
- 6.3 Fault Model
- 6.3.1 Fault vectors.
- 6.4 Latin Squares
- 6.5 Mutually Orthogonal Latin Squares
- 6.6 Pairwise Design: Binary Factors
- 6.7 Pairwise Design: Multi-Valued Factors
- 6.7.1 Shortcomings of using MOLS for test design
- 6.8 Orthogonal Arrays
- 6.8.1 Mixed-level orthogonal arrays
- 6.9 Covering and Mixed-Level Covering Arrays
- 6.9.1 Mixed-level covering arrays
- 6.10 Arrays of Strength > 2
- 6.11 Generating Covering Arrays
- 6.12 Tools
- Part III: Test Adequacy Assessment and Enhancement
- Chapter 7: Test Adequacy Assessment Using Control Flow and Data Flow
- 7.1 Test Adequacy: Basics
- 7.1.1 What is test adequacy?
- 7.1.2 Measurement of test adequacy
- 7.1.3 Test enhancement using measurements of adequacy
- 7.1.4 Infeasibility and test adequacy
- 7.1.5 Error detection and test enhancement
- 7.1.6 Single and multiple executions
- 7.2 Adequacy Criteria Based on Control Flow
- 7.2.1 Statement and block coverage
- 7.2.2 Conditions and decisions
- 7.2.3 Decision coverage
- 7.2.4 Condition coverage
- 7.2.5 Condition/decision coverage
- 7.2.6 Multiple condition coverage
- 7.2.7 Linear code sequence and jump (LCSAJ) coverage
- 7.2.8 Modified condition/decision coverage
- 7.2.9 MC/DC adequate tests for compound conditions
- 7.2.10 Definition of MC/DC coverage
- 7.2.11 Minimal MC/DC tests
- 7.2.12 Error detection and MC/DC adequacy
- 7.2.13 Short-circuit evaluation and infeasibility
- 7.2.14 Basis path coverage
- 7.2.15 Tracing test cases to requirements
- 7.3 Concepts From Data Flow
- 7.3.1 Definitions and uses
- 7.3.2 C-use and p-use
- 7.3.3 Global and local definitions and uses
- 7.3.4 Data flow graph
- 7.3.5 Def-clear paths
- 7.3.6 Def-use pairs
- 7.3.7 Def-use chains
- 7.3.8 A little optimization
- 7.3.9 Data contexts and ordered data contexts
- 7.4 Adequacy Criteria Based on Data Flow
- 7.4.1 c-use coverage.
- 7.4.2 p-use coverage
- 7.4.3 All-uses coverage
- 7.4.4 k-dr chain coverage
- 7.4.5 Using the k-dr chain coverage
- 7.4.6 Infeasible c- and p-uses
- 7.4.7 Context coverage
- 7.5 Control Flow Versus Data Flow
- 7.6 The "Subsumes" Relation
- 7.7 Structural and Functional Testing
- 7.8 Scalability of Coverage Measurement
- 7.9 Tools
- Chapter 8: Test Adequacy Assessment using Program Mutation
- 8.1 Introduction
- 8.2 Mutation and Mutants
- 8.2.1 First order and higher order mutants
- 8.2.2 Syntax and semantics of mutants
- 8.2.3 Strong and weak mutations
- 8.2.4 Why mutate ?
- 8.3 Test Assessment Using Mutation
- 8.3.1 A procedure for test adequacy assessment
- 8.3.2 Alternate procedures for test adequacy assessment
- 8.3.3 "Distinguished" versus "killed" mutants
- 8.3.4 Conditions for distinguishing a mutant
- 8.4 Mutation Operators
- 8.4.1 Operator types
- 8.4.2 Language dependence of mutation operators
- 8.5 Design of Mutation Operators
- 8.5.1 Goodness criteria for mutation operators
- 8.5.2 Guidelines
- 8.6 Founding Principles of Mutation Testing
- 8.6.1 The competent programmer hypothesis
- 8.6.2 The coupling effect
- 8.7 Equivalent Mutants
- 8.8 Fault Detection Using Mutation
- 8.9 Types of Mutants
- 8.10 Mutation Operators for C
- 8.10.1 What is not mutated ?
- 8.10.2 Linearization
- 8.10.3 Execution sequence
- 8.10.4 Effect of an execution sequence
- 8.10.5 Global and local identifier sets
- 8.10.6 Global and local reference sets
- 8.10.7 Mutating program constants
- 8.10.8 Mutating operators
- 8.10.9 Binary operator mutations
- 8.10.10 Mutating statements
- 8.10.11 Mutating program variables
- 8.10.12 Structure Reference Replacement
- 8.11 Mutation Operators for Java
- 8.11.1 Traditional mutation operators
- 8.11.2 Inheritence
- 8.11.3 Polymorphism and dynamic binding.
- 8.11.4 Method overloading.
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9788131794760
- 8131794768
- OCLC:
- 1024284052
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