Monolithic nanoscale photonics-electronics integration in silicon and other group IV elements / Henry Radamson, Lars Thylén.

Format:

Book

Author/Creator:

Radamson, Henry, author.

Thylén, Lars, author.

Language:

English

Subjects (All):

Nanoelectronics.

Nanophotonics.

Physical Description:

1 online resource (183 p.)

Edition:

1st edition

Place of Publication:

London, England ; San Diego, California : Academic Press, 2015.

Language Note:

English

System Details:

text file

Summary:

Silicon technology is evolving rapidly, particularly in board-to-board or chip-to chip applications. Increasingly, the electronic parts of silicon technology will carry out the data processing, while the photonic parts take care of the data communication. For the first time, this book describes the merging of photonics and electronics in silicon and other group IV elements. It presents the challenges, the limitations, and the upcoming possibilities of these developments. The book describes the evolution of CMOS integrated electronics, status and development, and the fundamentals of silicon p

Contents:

Front Cover; Monolithic Nanoscale Photonics-Electronics Integration in Silicon and Other Group IV Elements; Copyright Page; Contents; Acknowledgments; Introduction: Scope and Purpose of Book; 1 Metal Oxide Semiconductor Field Effect Transistors; Part One: Basics of Metal Oxide Semiconductor Field Effect Transistors; Surface Space-Charge Regions in MOSFETs; Leakage Components in MOSFETs; Subthreshold Current; Gate-Oxide Leakage; S/D Junction Leakage; MOS Capacitors; Static Characterization of MOSFETs; Transfer from 2D to 3D Nanoscaled Transistors; Gate Integration in FinFETs

Parasitic Sources in MOSFET StructureLithography of Nanoscaled MOSFETs; Sidewall Transfer Lithography; Part Two: Strain Engineering in Group IV Materials; Strain Design for MOSFETs; Strain Effect on Carrier Mobility; Basic Definitions; Carrier Mobility in MOSFETs with Strained Si Channel; Strain and Critical Thickness; Global Critical Thickness of SiGe Layers; Critical Thickness of SiGe Layers on Patterned Substrates; Critical Thickness of SiGe Layers Grown on Nano Features; Strain Measurements and Applications; Strain Measurement; Raman Spectroscopy; TEM Analysis

High-Resolution X-Ray AnalysisPart Three: Chemical Vapor Deposition of Group IV Materials; Selective and Nonselective Epitaxy; Part Four: Improvement of the Channel Mobility; Effect of Recess Shape in S/D; Channel Materials and Mobility; III-V Materials; Graphene Material; Silicene, Germanene, and Other Similar 2D Materials; Germanium Material; References; 2 Basics of Integrated Photonics; General; Buried Channel Waveguide; Strip-Loaded Waveguide; Ridge Waveguide; Rib Waveguide; Basics of Lasers, Modulators, Detectors, and Wavelength Selective Devices; Lasers; Basics Of Photonic Detectors

Detector CharacteristicsResponsivity; Dark Current; Noise Characteristics of Photodetectors; Modulators: Principles and Mechanisms of Optical Modulation; Photonics Switches: Spatial Routing of High-Speed Data Streams; Switches; Devices for Wavelength Division Multiplexed Systems; Devices Based on Spectrally Dependent Interference Effects; References; 3 Silicon and Group IV Photonics; Part One: Silicon Photonics Elements for Integrated Photonics; General Properties; Silicon Photonics Elements for Integrated Photonics: Modulators and Wavelength Selective Devices

Silicon Electro-Optic ModulatorsWavelength Selective Devices in Silicon; The Ring Resonator; Part Two: Bandgap Engineering in Group IV Materials for Photonic Application; Part Three: Group IV Photodetectors; Integration of Photodiodes with Waveguide or MOSFETs; PhotoMOSFETs; Group IV-Based Lasers; Part Four: Graphene, New Photonic Material; Photodetectors; References; 4 Moore's Law for Photonics and Electronics; Downscaling of CMOS; Evolution of Logic CMOS Since 1970; Prior to NTRS and ITRS Roadmaps; After NRTS and ITRS; Future of Logic CMOS and Beyond CMOS; Transistor Physical Parameters

Lithography

Notes:

Description based upon print version of record.

Includes bibliographical references.

Description based on online resource; title from PDF title page (ebrary, viewed September 24, 2014).

ISBN:

9780124199965

0124199968

OCLC:

893919823