1 option
2017 Far East NDT New Technology & Application Forum : 22-24 June 2017, Xi'an, China / IEEE Computer Society.
- Format:
- Book
- Conference/Event
- Conference Name:
- Far East NDT New Technology & Application Forum (2017 : Xi'an, China)
- Language:
- English
- Subjects (All):
- Nondestructive testing--Technological innovations--Congresses.
- Nondestructive testing.
- Physical Description:
- 1 online resource (100 pages)
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers, 2017.
- Notes:
- Description based on: online resource; title from pdf title page (IEEE Xplore, viewed March 26, 2020).
- ISBN:
- 1-5386-1615-7
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