2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) / Institute of Electrical and Electronics Engineers ; Panepistēmio Athēnōn, contributor.

Format:

Book

Author/Creator:

Institute of Electrical and Electronics Engineers, author, issuing body.

Contributor:

Panepistēmio Athēnōn, contributor.

Language:

English

Subjects (All):

Electronic circuit design--Congresses.

Electronic circuit design.

Error-correcting codes (Information theory).

Physical Description:

1 online resource : illustrations

Other Title:

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design

Place of Publication:

Piscataway, N.J. : IEEE, 2017.

Summary:

On line testing and more generally design for robustness, are important in modern electronic systems. These needs increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins process, voltage and temperature variations aging and wear out soft error and EMI sensitivity and power density and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs Design for reliability is also mandatory for reducing power dissipation, as reducing voltage for reducing power strongly affects reliability by reducing noise margins and thus the sensitivity to soft errors and EMI, and by increasing circuit delays which increase sensitivity to timing faults Design for Security is also strongly related with Design for Reliability, as security attacks are often fault based IOLTS is an established forum for presenting novel ideas and experimental data on these areas.

Notes:

Description based on publisher supplied metadata and other sources.

Includes bibliographical references.

ISBN:

1-5386-0352-7