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2017 IEEE 26th Asian Test Symposium (ATS) / Institute of Electrical and Electronics Engineers (IEEE).
- Format:
- Book
- Author/Creator:
- Institute of Electrical and Electronics Engineers (IEEE), author, issuing body.
- Language:
- English
- Subjects (All):
- Electronic circuits--Testing--Congresses.
- Electronic circuits.
- Fault-tolerant computing--Congresses.
- Fault-tolerant computing.
- Physical Description:
- 1 online resource : illustrations
- Other Title:
- 2017 IEEE 26th Asian Test Symposium
- Place of Publication:
- Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE), 2017.
- Summary:
- The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 9781538624371
- 1538624370
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