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Transmission electron microscopy characterization of nanomaterials / Challa S.S.R. Kumar, editor.

SpringerMaterials - The Landolt-Börnstein Database Available online

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Format:
Book
Contributor:
Kumar, C. S. S. R. (Challa S. S. R.), editor.
Series:
Gale eBooks
Language:
English
Subjects (All):
Nanostructured materials.
Nanotechnology.
Physical Description:
1 online resource (ix, 716 pages) : illustrations (some color)
Edition:
1st ed. 2014.
Place of Publication:
Heidelberg [Germany] : Springer, 2014.
Language Note:
English
Summary:
Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.
Contents:
TEM Characterization of Biological and Inorganic Nanocomposites
Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials
TEM for Characterization of Semiconductor Nanomaterials
Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods
TEM for Characterization of Core-Shell Nanomaterials
Valence Electron Spectroscopy by Transmission Electron Microscopy
TEM Characterization of Nanocomposite Materials
High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires
Electron Microscopy for Characterization of Thermoelectric Nanomaterials
TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites
TEM Characterization of Metallic Nanocatalysts
3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures.
Notes:
Includes index.
Includes bibliographical references and index.
ISBN:
9783642389344
3642389341
OCLC:
880597936

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