My Account Log in

1 option

Trapped charged particles and fundamental interactions / edited by K. Blaum, F. Herfurth.

Lecture Notes in Physics 1969-2012 Archive Available online

View online
Format:
Book
Conference/Event
Contributor:
Blaum, K. (Klaus), editor.
Herfurth, F. (Frank), editor.
Conference Name:
Heraeus Winter School (2006 : Hirschegg, Austria)
Heraeus Winter School
Series:
Lecture Notes in Physics, 0075-8450 ; 749
Language:
English
Subjects (All):
Trapped ions--Congresses.
Trapped ions.
Particles (Nuclear physics)--Congresses.
Particles (Nuclear physics).
Physical Description:
1 online resource (VIII, 192 p. 125 illus.)
Edition:
1st ed. 2008.
Place of Publication:
Berlin, Germany : Springer, [2008]
Language Note:
English
Summary:
The development of ion traps has spurred significant experimental activities able to link measurable quantities to the most fundamental aspects of physics. The first chapter sets the scene and motivates the use of ion traps with an in-depth survey of the low-energy electroweak sector of the standard model amenable to precision test. The next parts then introduce and review aspects of the theory, simulation and experimental implementation of such traps. Last but not least, two important applications, namely high resolution mass spectrometry in Penning traps and tests of fundamental physics - such as the CPT theorem - with trapped antiprotons are discussed. This volume bridges the gap between the graduate textbook and the research literature and will assist graduate students and newcomers to the field in quickly entering and mastering the subject matter.
Contents:
Low-Energy Precision Tests of Electroweak Theory
Principles of Ion Traps
Simulations for Ion Traps Methods and Numerical Implementation
Simulations for Ion Traps Buffer Gas Cooling
Highly-charged ions and high-resolution mass spectrometry in a Penning trap
Fundamental tests with trapped antiprotons.
Notes:
Contributions from a Heraeus Winter School that took place in Hirschegg, Austria in spring 2006.
Includes bibliographical references and index.
Description based on print version record.
ISBN:
9783540778172
3540778179

The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.

Find

Home Release notes

My Account

Shelf Request an item Bookmarks Fines and fees Settings

Guides

Using the Find catalog Using Articles+ Using your account