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RF-MEMS technology for high-performance passives : the challenge of 5G mobile applications / Jacopo Iannacci.

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Format:
Book
Author/Creator:
Iannacci, Jacopo, author.
Contributor:
Institute of Physics (Great Britain), publisher.
Series:
IOP (Series). Release 4.
IOP expanding physics
[IOP release 4]
IOP expanding physics, 2053-2563
Language:
English
Subjects (All):
Radio frequency microelectromechanical systems.
Passive components.
Mobile apps.
Physical Description:
1 online resource (various pagings) : illustrations (some color).
Other Title:
Radio frequency microelectromechanical system technology for high-performance passives : the challenge of 5G mobile applications.
Place of Publication:
Bristol [England] : IOP Publishing, [2017]
System Details:
Mode of access: World Wide Web.
System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
text file
Biography/History:
Jacopo Iannacci is Researcher in MEMS technology with the Center for Materials and Microsystems (CMM) at Fondazione Bruno Kessler (FBK) in Trento, Italy, since 2007. His scientific focuses are on (compact) modelling, design, optimisation, integration, packaging and testing for reliability of RF-MEMS (Radio Frequency MicroElectroMechanical Systems) passive devices/networks, EH-MEMS (Energy Harvesting MEMS), as well as SA-MEMS (MEMS Sensors and Actuators). He received a MSc in Electronic Engineering (2003) from the University of Bologna, Italy, and the PhD in Information Technology (2007) from the ARCES Center of Excellence at the University of Bologna, Italy, with focus on mixed domain simulation and hybrid wafer-level packaging of RF-MEMS devices for wireless applications. In 2005 and 2006, Jacopo Iannacci worked as Visiting Researcher at the DIMES Technology Center of the Technical University of Delft, the Netherlands, where he focused on the development of packaging and integration solutions for RF-MEMS devices. In 2016, he visited the Fraunhofer Institute for Reliability and Microintegration IZM in Berlin, Germany, as Seconded Researcher, studying the integration of RF-MEMS devices and their optimisation against market requirements. Jacopo Iannacci has authored and co-authored numerous scientific contributions for international journals and conference proceedings, as well as books and several book chapters in the field of MEMS and RF-MEMS technology.
Summary:
Commencing with a review of the characteristics of RF-MEMS in relation to 5G, the book proceeds to develop practical insight concerning the design and development of RF-MEMS including case studies of design concepts. Including multiphysics simulation and animated figures, the book will be essential reading for both academic and industrial researchers and engineers.
Contents:
1. Introduction to MEMS and RF-MEMS : from the early days of microsystems to modern RF-MEMS passives
1.1. Introduction to semiconductor and microsystem technologies
1.2. Introduction to RF-MEMS
2. Expectations versus actual market of RF-MEMS : analysis and explanation of a repeatedly fluctuating scenario
2.1. General considerations of the market in the technology sector
2.2. RF-MEMS on the market : vision of the early days
2.3. Fluctuating RF-MEMS market forecasts
2.4. Analysis of RF-MEMS market expectations (disappointment)
2.5. The RF-MEMS market today
3. The future 5th generation (5G) of mobile networks : challenges and opportunities of an impelling scenario
3.1. General considerations on mobile telecommunication networks
3.2. Evolution of mobile standards and services
3.3. The future 5th generation
5G
4. RF-MEMS passives for 5G applications : case studies and design examples
4.1. An introduction on RF passives' specifications trends in 5G
4.2. A few notes about the RF-MEMS technology platform
4.3. Electromechanical simulation of RF-MEMS devices
4.4. Electromagnetic simulation of RF-MEMS devices
Appendix A. Moving MEMS : dynamics down in the micro-world.
Notes:
"Version: 20171101"--Title page verso.
Includes bibliographical references.
Title from PDF title page (viewed on December 11, 2017).
Other Format:
Print version:
ISBN:
9780750315456
9780750315449
OCLC:
1015235220
Access Restriction:
Restricted for use by site license.

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