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Proceedings of the 2000 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
- Format:
- Book
- Conference/Event
- Author/Creator:
- Brandwajn, Alexandre
- International Conference on Measurement and Modeling of Computer Systems, Corporate Author.
- Conference Name:
- International Conference on Measurement and Modeling of Computer Systems (2000 : Santa Clara, Calif.)
- Series:
- ACM Conferences
- Language:
- English
- Physical Description:
- 1 online resource (329 pages)
- Other Title:
- Proceedings of the 2000 Association for Computing Machinery Special Interest Group on Measurement and Evaluation International Conference on Measurement and Modeling of Computer Systems
- ACM SIGMETRICS 2000 The International Conference on Measurement and Modeling of Computer Systems, Santa Clara, CA, USA - June 18 - 21, 2000
- Place of Publication:
- [Place of publication not identified] ACM 2000
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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