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Proceedings of the 2000 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems

ACM Digital Library Available online

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Format:
Book
Conference/Event
Author/Creator:
Brandwajn, Alexandre
International Conference on Measurement and Modeling of Computer Systems, Corporate Author.
Contributor:
Kurose, Jim, Contributor.
Brandwajn, Alexandre, Contributor.
ACM Digital Library.
Conference Name:
International Conference on Measurement and Modeling of Computer Systems (2000 : Santa Clara, Calif.)
Series:
ACM Conferences
Language:
English
Physical Description:
1 online resource (329 pages)
Other Title:
Proceedings of the 2000 Association for Computing Machinery Special Interest Group on Measurement and Evaluation International Conference on Measurement and Modeling of Computer Systems
ACM SIGMETRICS 2000 The International Conference on Measurement and Modeling of Computer Systems, Santa Clara, CA, USA - June 18 - 21, 2000
Place of Publication:
[Place of publication not identified] ACM 2000
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph

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