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SIGMETRICS'10 : proceedings of the 2010 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, June 14-18, 2010, New York, New York, USA
- Format:
- Book
- Conference/Event
- Author/Creator:
- Misra, Vishal
- International Conference on Measurement and Modeling of Computer Systems, Corporate Author.
- Conference Name:
- International Conference on Measurement and Modeling of Computer Systems (2010 : New York, N.Y.)
- Series:
- ACM Conferences
- Language:
- English
- Physical Description:
- 1 online resource (386 pages)
- Other Title:
- SIGMETRICS'10 : proceedings of the 2010 Association for Computing Machinery Special Interest Group on Measurement and Evaluation International Conference on Measurement and Modeling of Computer systems, June 14-18, 2010, New York, New York, United States of America
- Proceedings of the ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems
- SIGMETRICS '10 ACM SIGMETRICS International Conference on Measurement and Modeling of Computer Systems, New York, NY, USA - June 14 - 18, 2010
- Place of Publication:
- [Place of publication not identified] ACM 2010
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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